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我本科自动化,master想学VLSI. 但是这个方面之学过EDA(VHDL语言。。)
我找了一个已经录取我的大学的一些课程,大家帮我看看能不能满足做VLSI design 或者verification的需要
ELEC 6190/6196. Introduction to Digital and Analog IC Design. Χ
(3). Pr.,ELEC 2210, ELEC 3700.
Introduction to digital and analog integrated circuit (IC) design with emphasis on front-end IC design skills. Digital IC designs using Verilog hardware description language. Analog IC designs using Cadence analog IC design tools. Gain hands-on experience through digital and analog IC design projects.
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ELEC 6200/6206. Computer Architecture and Design
(3) Lec. 3. Pr., ELEC 4200.
Structural organization and hardware design of digital computers; register transfers; micro-operations, control units and timing; instruction set design; input/output devices, multiprocessors, automated hardware design aids.
ELEC 6250/6256. Computer-Aided Design of Digital Circuits
(3) Lec. 3. Pr., ELEC 2220 or COMP 3350.. check 1point3acres for more.
Computer-automated design of digital logic circuits, using discrete gates, programmable logic devices, and standard cells, hardware description languages, circuit simulation for design verification and analysis, fault diagnosis and testing.
.1point3acres
ELEC 6260/6266. Embedded Computing Systems
(3). Pr. ELEC 2220 or COMP 3350.
The design of systems containing embedded computers. Microcontroller technology, assembly language and C programming, input/output interfacing, data acquisition hardware, interrupts, and timing. Real-time operating systems and application programming. Embedded system application examples.
ELEC 6280/6286. Built-In Self-Test (3). Lec. 3. Pr. ELEC 2200, ELEC 2210l.
Testing during product life-cycle, fault models and detection, design for testability, test pattern generation, output response analysis, concurrent fault detection, manufacturing and system use, built-in self-test approaches and applications.
ELEC 6770/6776. VLSI Design.1point3acres
(3) Lec. 3. Pr., ELEC 2210, ELEC 2220.
Review of MOS transistor fundamentals, CMOS logic circuits; VLSI fabrication and design rules; clocking strategies and sequential design; performance estimation; memories and programmable arrays; standard cell design methodologies; computer aided design (CAD) tools.
ELEC 7250/7256. VLSI Testing
(3) Lec. 3. Pr., ELEC 6770.. .и
Exponential nature of the test problem, fault models, test generation algorithms, test generation for sequential circuits, fault simulation, testability measures, fault coverage, yield and defect levels, design-for-testability approaches, scan and boundary scan, IDDQ testing, mixed signal testing.. 1point 3acres
ELEC 7770/7776. Advanced VLSI Design
(3) Lec. 3. Pr. ELEC 6770 or departmental approval.
Review of CMOS logic circuits; impact of fabrication issues on design; high speed switching circuits; high performance memory structures; advanced clocking strategies and clock distribution; performance optimization; deep submicron design issues; ASIC design flow: logic synthesis, placement and routing; design verification; low power design. |